Tender: Laser-Based Photonic Component Testing System – High-Speed Wavelength Sweep with Sub-Picometer Resolution
Released 4 months ago
About
Funding is available to purchase a laser-based photonic component testing system capable of rapidly modifying wavelength at >100 nm/s sweep rate with sub-picometer wavelength resolution and accurate measurement of wavelength-dependent power to characterise a device under test (DUT); the system is intended to complement photonics capabilities available to the QTIC/BIZ community.
This tender will be most relevant to suppliers of high-precision optical test equipment, university or commercial photonics labs, and integrators experienced in laser-based measurement systems. Key considerations are the need to demonstrably meet the specified >100 nm/s sweep rate, sub-picometer wavelength resolution, and accurate wavelength-dependent power measurement, and to ensure compatibility with existing photonics setups.
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